Marcilei Aparecida Guazzelli

According to our database, Marcilei Aparecida Guazzelli authored at least 8 papers between 2017 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Impact of Partial TMR on RISC-V Processor Reliability.

Eduardo Marañon Aguilar, Fabio Benevenuti, Fernanda L. Kastensmidt, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli

IEEE Des. Test, April, 2026

2025

Exploring Fault Tolerance to Ionizing Radiation in Severe Environments: Power Transistors with Distinct Layouts.

Paulo R. Garcia, Guilherme I Grandesi, Alexis C. Vilas Bôas, Renato C. Giacomini, Nilberto H. Medina, Luis Eduardo Seixas Jr., Marcilei Aparecida Guazzelli

Proceedings of the 16th IEEE Latin America Symposium on Circuits and Systems, 2025

2023

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

J. Electron. Test., August, 2023

2021

Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs.

Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen

J. Electron. Test., 2021

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems.

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2018

Single event effect: Simulations and analysis on 3N163 PMOS transistor.

Juliano Oliveira, Marcilei Aparecida Guazzelli, Marco Antonio Assis, Renato C. Giacomini

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA.

Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Ionizing radiation effects on a COTS low-cost RISC microcontroller.

Felipe G. H. Leite, Roberto B. B. Santos, Nilberto H. Medina, Vitor A. P. Aguiar, Renato C. Giacomini, Nemitala Added, Fernando Aguirre, Eduardo L. A. Macchione, Fabian Vargas, Marcilei Aparecida Guazzelli da Silveira

Proceedings of the 18th IEEE Latin American Test Symposium, 2017