M. Millesimo

According to our database, M. Millesimo authored at least 5 papers between 2022 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

HTGB and DGS Reliability Assessment of e-mode GaN-HEMTs with Ferroelectric Gate Stack.

Andrea Natale Tallarico, M. Millesimo, U. Ibrar, Enrico Sangiorgi, Claudio Fiegna, T.-Y. Yang, J.-S. Wu, H. Iwai, E.-Y. Chang

Proceedings of the IEEE International Reliability Physics Symposium, 2025

RTN Analysis of Schottky p-GaN Gate HEMTs Under Forward Gate Stress: Impact of Temperature.

M. Millesimo, L. Valentini, Claudio Fiegna, Enrico Sangiorgi, Andrea Natale Tallarico, Matteo Borga, Niels Posthuma, Stefaan Decoutere, Benoit Bakeroot

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

A Convolutional-Transformer Model for FFR and iFR Assessment From Coronary Angiography.

Raffaele Mineo, Federica Proietto Salanitri, Giovanni Bellitto, Isaak Kavasidis, Ovidio De Filippo, M. Millesimo, Gaetano Maria de Ferrari, Marco Aldinucci, Daniela Giordano, Simone Palazzo, Fabrizio D'Ascenzo, Concetto Spampinato

IEEE Trans. Medical Imaging, August, 2024

Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate.

M. Millesimo, Claudio Fiegna, Benoit Bakeroot, Matteo Borga, Niels Posthuma, Stefaan Decoutere, Enrico Sangiorgi, Andrea Natale Tallarico

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022

Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition.

M. Millesimo, Benoit Bakeroot, Matteo Borga, Niels Posthuma, Stefaan Decoutere, Enrico Sangiorgi, Claudio Fiegna, Andrea Natale Tallarico

Proceedings of the IEEE International Reliability Physics Symposium, 2022