M. Taurin

According to our database, M. Taurin authored at least 3 papers between 2001 and 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2003

Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology.

Yannick Rey-Tauriac, Olivier de Sagazan, M. Taurin, Olivier Bonnaud

Microelectron. Reliab., 2003

2001

High reliability power VDMOS Transistors in Bipolar/CMOS/DMOS technology.

Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud

Microelectron. Reliab., 2001

Wafer Level Accelerated test for ionic contamination control on VDMOS transistors in Bipolar/CMOS/DMOS.

Yannick Rey-Tauriac, M. Taurin, Olivier Bonnaud

Microelectron. Reliab., 2001