M. Z. Lin

According to our database, M. Z. Lin authored at least 5 papers between 2001 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2020

Comprehensive Quality and Reliability Management for Automotive Product.

M. H. Hsieh, W. S. Chiang, Harry H. Chen, M. Z. Lin, M. J. Lin

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

High Voltage Tolerant Design with Advanced Process for TV Application.

S. E. Liu, M. H. Hsieh, Y. R. Chen, J. Y. Jao, M. Z. Lin, Y. H. Fang, M. J. Lin

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Fast chip aging prediction by product-like VMIN drift characterization on test structures.

S. E. Liu, G. Y. Chen, M. K. Chen, David Yen, W. A. Kuo, C. S. Fu, Y. S. Tsai, M. Z. Lin, Y. H. Fang, M. J. Lin

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2004

Analysis of the layout impact on electric fields in interconnect structures using finite element method.

Changsoo Hong, Linda Milor, M. Z. Lin

Microelectron. Reliab., 2004

2001

VLLCVD Subjective Image Fidelity Criterion and Its Applications.

Day-Fann Shen, Jen-Hsing Sung, W. C. Fan, M. Z. Lin, J. G. Fun, Z. H. Shen, F. K. Tsai, Y. Z. Shin

Proceedings of the PICS 2001: Image Processing, 2001