Mamoru Ishizaka

Orcid: 0000-0001-5799-872X

According to our database1, Mamoru Ishizaka authored at least 3 papers between 2018 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2021
Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for Memristor Neural Network.
Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit.
J. Electron. Test., 2020

2018
Area-Efficient and Reliable Hybrid CMOS/Memristor ECC Circuit for ReRAM Storage.
Proceedings of the 27th IEEE Asian Test Symposium, 2018


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