Mamoru Ishizaka
Orcid: 0000-0001-5799-872X
According to our database1,
Mamoru Ishizaka
authored at least 3 papers
between 2018 and 2021.
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Bibliography
2021
Robust Fault-Tolerant Design Based on Checksum and On-Line Testing for Memristor Neural Network.
Proceedings of the 30th IEEE Asian Test Symposium, 2021
2020
Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit.
J. Electron. Test., 2020
2018
Proceedings of the 27th IEEE Asian Test Symposium, 2018