Masahiro Horibe

Orcid: 0000-0002-1193-607X

According to our database1, Masahiro Horibe authored at least 24 papers between 2007 and 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2021
Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz.
IEEE Trans. Instrum. Meas., 2021

2020
Precision Adjustment of Probe-Tilt Angle With RF Signal Detection Technique.
IEEE Trans. Instrum. Meas., 2020

Electromagnetic Measurement Techniques for Materials and Device Used in 6G Wireless Communications.
Proceedings of the 2nd 6G Wireless Summit, 2020

2019
Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process.
IEEE Trans. Instrum. Meas., 2019

Broadband Permittivity Measurements up to 170-GHz Using Balanced-Type Circular-Disk Resonator Excited by 0.8-mm Coaxial Line.
IEEE Trans. Instrum. Meas., 2019

Improvement of Broadband Characterization of Dielectric Waveguide at the $Ka$ -Band by Using TRL Calibration Method.
IEEE Trans. Instrum. Meas., 2019

Measurement Capability of Scanning Microwave Microscopy: Measurement Sensitivity Versus Accuracy.
IEEE Trans. Instrum. Meas., 2019

Transmission loss of screen-printed metallization at millimeter-wave frequency.
IEICE Electron. Express, 2019

2018
Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency.
IEEE Trans. Instrum. Meas., 2018

Nondestructive method using transmission line for detection of foreign objects in food.
Proceedings of the 2018 IEEE Sensors Applications Symposium, 2018

2017
Coaxial Connector Conversion Method for Traceable Scattering Parameter Measurement.
IEEE Trans. Instrum. Meas., 2017

Improvement of Transmission/Reflection Method for Permittivity Measurement Using Long Fixtures With Time-Domain Analysis Approach.
IEEE Trans. Instrum. Meas., 2017

New Permittivity Measurement Methods Using Resonant Phenomena For High-Permittivity Materials.
IEEE Trans. Instrum. Meas., 2017

Development of S-Parameter Calibration System for Type-N, 75-Ω Connector Below 12 GHz.
IEEE Trans. Instrum. Meas., 2017

Measurement Uncertainty Model for Vector Network Analyzers With Frequency Extension Modules at Terahertz Frequencies.
IEEE Trans. Instrum. Meas., 2017

2016
Low Cost, High Performance of Coplanar Waveguide Fabricated by Screen Printing Technology.
IEICE Trans. Electron., 2016

2015
New Uncertainty Analysis for Permittivity Measurements Using the Transmission/Reflection Method.
IEEE Trans. Instrum. Meas., 2015

2014
Comparison of Calculation Techniques for Q-Factor Determination of Resonant Structures Based on Influence of VNA Measurement Uncertainty.
IEICE Trans. Electron., 2014

2013
Establishment of S-parameter Traceability for 3.5 mm Coaxial Lines from 10 MHz to 100 MHz.
IEEE Trans. Instrum. Meas., 2013

Metrological Traceability in Waveguide S-parameter Measurements at 1.0 THz Band.
IEEE Trans. Instrum. Meas., 2013

2011
Comparison Between NPL and NMIJ of Diameter and Scattering Parameter Measurements of Precision 1.85 mm Coaxial Air Lines.
IEEE Trans. Instrum. Meas., 2011

2009
Development of Evaluation Techniques for Air Lines in 3.5- and 1.0-mm Line Sizes.
IEEE Trans. Instrum. Meas., 2009

Comparison Between Two National Metrology Institutes of Diameters and Characteristic Impedance of Coaxial Air Lines.
IEEE Trans. Instrum. Meas., 2009

2007
S-Parameters of Standard Airlines Whose Connector Is Tightened With Specified Torque.
IEEE Trans. Instrum. Meas., 2007


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