Nick M. Ridler

According to our database, Nick M. Ridler authored at least 23 papers between 2003 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Characterizing S-Parameters of Microwave Coaxial Devices With up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications.

Manoj Stanley, Martin J. Salter, Jonas Urbonas, James Skinner, Sang-Hee Shin, Sebastian De Graaf, Nick M. Ridler

IEEE Trans. Instrum. Meas., 2024

Improvements to Millimeter-Wave Dielectric Measurement Using Material Characterization Kit (MCK).

Minjie Shu, Xiaobang Shang, Nick M. Ridler, Antoine R. Calleau, Alexandros I. Dimitriadis, Anxue Zhang

IEEE Trans. Instrum. Meas., 2024

2023

3-D Printed THz Waveguide Components.

Liyan Zhu, Sang-Hee Shin, Roshan Payapulli, Ian W. Rossuck, Norbert Klein, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2023

Determination of the Permittivity of Transmission Lines at Milli-Kelvin Temperatures.

Manoj Stanley, Rowan Parker-Jervis, James Skinner, Sebastian De Graaf, Tobias Lindström, John Cunningham, Nick M. Ridler

IEEE Access, 2023

Polymer-Based 3-D Printed 140 to 220 GHz Metal Waveguide Thru Lines, Twist and Filters.

Roshan Payapulli, Liyan Zhu, Sang-Hee Shin, Manoj Stanley, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2023

2022

Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA.

Dilbagh Singh, Martin J. Salter, Susan Johny, Nick M. Ridler

IEEE Instrum. Meas. Mag., 2022

3-D Printing Quantization Predistortion Applied to Sub-THz Chained-Function Filters.

Liyan Zhu, Roshan Payapulli, Sang-Hee Shin, Manoj Stanley, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2022

Characterizing Scattering Parameters of Superconducting Quantum Integrated Circuits at Milli-Kelvin Temperatures.

Manoj Stanley, Sebastian De Graaf, Teresa Hönigl-Decrinis, Tobias Lindström, Nick M. Ridler

IEEE Access, 2022

3-D Printed Plug and Play Prototyping for Low-Cost Sub-THz Subsystems.

Sang-Hee Shin, Roshan Payapulli, Liyan Zhu, Manoj Stanley, Xiaobang Shang, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2022

2021

Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies.

Dongdong Ma, Xiaobang Shang, Nick M. Ridler, Wen Wu

IEEE Trans. Instrum. Meas., 2021

Polymer-Based 3-D Printed 140-220 GHz Low-Cost Quasi-Optical Components and Integrated Subsystem Assembly.

Sang-Hee Shin, Xiaobang Shang, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2021

Microwave Characterization of Conductive PLA and Its Application to a 12 to 18 GHz 3-D Printed Rotary Vane Attenuator.

Enrique Marquez-Segura, Sang-Hee Shin, Attique Dawood, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2021

2020

Characterization of Dielectric Materials at WR-15 Band (50-75 GHz) Using VNA-Based Technique.

Yi Wang, Xiaobang Shang, Nick M. Ridler, Tongde Huang, Wen Wu

IEEE Trans. Instrum. Meas., 2020

Ultra-Wideband Terahertz Channel Propagation Measurements from 500 to 750 GHz.

Demos Serghiou, Mohsen Khalily, S. Johny, M. Stanley, I. Fatadin, Tim W. C. Brown, Nick M. Ridler, Rahim Tafazolli

Proceedings of the 2020 International Conference on UK-China Emerging Technologies, 2020

2019

Establishing a New Form of Primary Impedance Standard at Millimeter-Wave Frequencies.

Yasameen F. Azeez, Richard J. Collier, Nick M. Ridler, Paul R. Young

IEEE Trans. Instrum. Meas., 2019

Microwave Characterization of Low-Loss FDM 3-D Printed ABS With Dielectric-Filled Metal-Pipe Rectangular Waveguide Spectroscopy.

Jingye Sun, Attique Dawood, William J. Otter, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2019

Polymer-Based 3-D Printed Ku-Band Steerable Phased-Array Antenna Subsystem.

Sang-Hee Shin, Diyar F. Alyasiri, Mario D'Auria, William J. Otter, Connor W. Myant, Daniel Stokes, Zhengrong Tian, Nick M. Ridler, Stepan Lucyszyn

IEEE Access, 2019

2017

Metrology State-of-the-Art and Challenges in Broadband Phase-Sensitive Terahertz Measurements.

Mira Naftaly, Roland G. Clarke, David A. Humphreys, Nick M. Ridler

Proc. IEEE, 2017

2011

Comparison Between NPL and NMIJ of Diameter and Scattering Parameter Measurements of Precision 1.85 mm Coaxial Air Lines.

Masahiro Horibe, Nick M. Ridler

IEEE Trans. Instrum. Meas., 2011

2009

Comparison Between Two National Metrology Institutes of Diameters and Characteristic Impedance of Coaxial Air Lines.

Masahiro Horibe, Nick M. Ridler

IEEE Trans. Instrum. Meas., 2009

2003

Generalized adaptive calibration schemes for precision RF vector network analyzer measurements.

Andrew G. Morgan, Nick M. Ridler, Martin J. Salter

IEEE Trans. Instrum. Meas., 2003

Traceability via the Internet for microwave measurements using vector network analyzers.

Richard A. Dudley, Nick M. Ridler

IEEE Trans. Instrum. Meas., 2003

An interpolation scheme for precision intermediate frequency reflection coefficient measurement.

Maurice G. Cox, Mark P. Dainton, Nick M. Ridler, Martin J. Salter, P. R. Young

IEEE Trans. Instrum. Meas., 2003