Matchima Buddhanoy

According to our database, Matchima Buddhanoy authored at least 9 papers between 2021 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Descrambling the Scrambler: Experimental Extraction of Data Scrambling Keys in COTS NAND Flash.

Matchima Buddhanoy, Habib Ur Rahman, Aleksandar Milenkovic, Sudeep Pasricha, Biswajit Ray

Proceedings of the 27th International Symposium on Quality Electronic Design, 2026

2025

Page-Overwrite Data Sanitization in 3D NAND Flash: Challenges, Feasibility, and the PULSE Solution.

Matchima Buddhanoy, Aleksandar Milenkovic, Sudeep Pasricha, Biswajit Ray

ACM Trans. Embed. Comput. Syst., 2025

2024

Fortifying the NAND Flash Supply Chain with Innovative Security Primitives.

Matchima Buddhanoy, Biswajit Ray

Proceedings of the 43rd IEEE/ACM International Conference on Computer-Aided Design, 2024

Life-after-Death: Exploring Thermal Annealing Conditions to Enhance 3D NAND SSD Endurance.

Matchima Buddhanoy, Sudeep Pasricha, Biswajit Ray

Proceedings of the 16th ACM Workshop on Hot Topics in Storage and File Systems, 2024

Improving Block Management in 3D NAND Flash SSDs with Sub-Block First Write Sequencing.

Matchima Buddhanoy, Kamil Khan, Aleksandar Milenkovic, Sudeep Pasricha, Biswajit Ray

Proceedings of the Great Lakes Symposium on VLSI 2024, 2024

2023

Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation.

Matchima Buddhanoy, Biswajit Ray

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Towards Improving Ionizing Radiation Tolerance of 3-D NAND Flash Memory.

Biswajit Ray, Matchima Buddhanoy, Mondol Anik Kumar

Proceedings of the IEEE International Memory Workshop, 2023

2022

Instant data sanitization on multi-level-cell NAND flash memory.

Md Raquibuzzaman, Matchima Buddhanoy, Aleksandar Milenkovic, Biswajit Ray

Proceedings of the SYSTOR '22: The 15th ACM International Systems and Storage Conference, Haifa, Israel, June 13, 2022

2021

Runtime Variability Monitor for Data Retention Characteristics of Commercial NAND Flash Memory.

Matchima Buddhanoy, Sadman Sakib, Biswajit Ray

Proceedings of the IEEE International Reliability Physics Symposium, 2021