Matthew Nigh
According to our database1,
Matthew Nigh
authored at least 3 papers
between 2022 and 2025.
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Bibliography
2025
Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration.
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025
2024
Proceedings of the IEEE International Test Conference, 2024
2022
Proceedings of the 2022 IEEE International Conference on Image Processing, 2022