Matthew Nigh
According to our database1,
Matthew Nigh authored at least 4 papers
between 2022 and 2025.
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Bibliography
2025
Enhancing Metrology to E-test Correlation Model Accuracy through Process Expertise Integration.
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025
Unveiling the Mask: Trusted Semiconductor Manufacturing through Wafer-Level Mask-Set Attestation.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2025
2024
Proceedings of the IEEE International Test Conference, 2024
2022
Proceedings of the 2022 IEEE International Conference on Image Processing, 2022