# John M. Carulli Jr.

According to our database

Collaborative distances:

^{1}, John M. Carulli Jr. authored at least 38 papers between 2004 and 2024.Collaborative distances:

## Timeline

#### Legend:

Book In proceedings Article PhD thesis Dataset Other## Links

#### On csauthors.net:

## Bibliography

2024

Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond.

IEEE Des. Test, 2024

2017

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Systematic defect detection methodology for volume diagnosis: A data mining perspective.

Proceedings of the IEEE International Test Conference, 2017

2016

IEEE Des. Test, 2016

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Proceedings of the 2016 IEEE International Test Conference, 2016

Variation and failure characterization through pattern classification of test data from multiple test stages.

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.

IEEE Des. Test, 2015

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.

Proc. IEEE, 2014

ACM J. Emerg. Technol. Comput. Syst., 2014

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.

Proceedings of the 2014 International Test Conference, 2014

Proceedings of the 2014 International Test Conference, 2014

Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.

Proceedings of the 2014 International Test Conference, 2014

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

2013

Predicting die-level process variations from wafer test data for analog devices: A feasibility study.

Proceedings of the 14th Latin American Test Workshop, 2013

Proceedings of the 2013 IEEE International Test Conference, 2013

Counterfeit electronics: A rising threat in the semiconductor manufacturing industry.

Proceedings of the 2013 IEEE International Test Conference, 2013

Test data analytics - Exploring spatial and test-item correlations in production test data.

Proceedings of the 2013 IEEE International Test Conference, 2013

A design-for-reliability approach based on grading library cells for aging effects.

Proceedings of the 2013 IEEE International Test Conference, 2013

Proceedings of the International Symposium on Quality Electronic Design, 2013

Proceedings of the 18th IEEE European Test Symposium, 2013

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Proceedings of the 2012 IEEE International Test Conference, 2012

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Proceedings of the Design, Automation and Test in Europe, 2010

2009

IEEE Des. Test Comput., 2009

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

IEEE Des. Test Comput., 2006

2005

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004