John M. Carulli Jr.

According to our database, John M. Carulli Jr. authored at least 38 papers between 2004 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond.

Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris

IEEE Des. Test, 2024

2017

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Systematic defect detection methodology for volume diagnosis: A data mining perspective.

Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2017

2016

Controlling Aging in Timing-Critical Paths.

Senthil Arasu, Mehrdad Nourani, John M. Carulli, Vijay Reddy

IEEE Des. Test, 2016

Consistency in wafer based outlier screening.

Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Pylon: Towards an integrated customizable volume diagnosis infrastructure.

Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli

Proceedings of the 2016 IEEE International Test Conference, 2016

Variation and failure characterization through pattern classification of test data from multiple test stages.

Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng

Proceedings of the 2016 IEEE International Test Conference, 2016

2015

Recycled IC Detection Based on Statistical Methods.

Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.

Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris

IEEE Des. Test, 2015

Yield prognosis for fab-to-fab product migration.

Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits.

Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.

Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris

Proc. IEEE, 2014

Reliability improvement of logic and clock paths in power-efficient designs.

Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli Jr., Gautam Kapila, Min Chen

ACM J. Emerg. Technol. Comput. Syst., 2014

Special session 11B: ITRS adaptive test update.

John M. Carulli

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Innovative practices session 5C: Machine learning and data analysis in test.

Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling.

Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler

Proceedings of the 2014 International Test Conference, 2014

IC laser trimming speed-up through wafer-level spatial correlation modeling.

Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2014 International Test Conference, 2014

Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.

Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2014 International Test Conference, 2014

Asymmetric aging of clock networks in power efficient designs.

Senthil Arasu, Mehrdad Nourani, Frank Cano, John M. Carulli, Vijay Reddy

Proceedings of the Fifteenth International Symposium on Quality Electronic Design, 2014

2013

Predicting die-level process variations from wafer test data for analog devices: A feasibility study.

Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 14th Latin American Test Workshop, 2013

Process monitoring through wafer-level spatial variation decomposition.

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2013 IEEE International Test Conference, 2013

Counterfeit electronics: A rising threat in the semiconductor manufacturing industry.

Ke Huang, John M. Carulli, Yiorgos Makris

Proceedings of the 2013 IEEE International Test Conference, 2013

Test data analytics - Exploring spatial and test-item correlations in production test data.

Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler

Proceedings of the 2013 IEEE International Test Conference, 2013

A design-for-reliability approach based on grading library cells for aging effects.

Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy

Proceedings of the 2013 IEEE International Test Conference, 2013

Performance entitlement by exploiting transistor's BTI recovery.

Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli

Proceedings of the International Symposium on Quality Electronic Design, 2013

On combining alternate test with spatial correlation modeling in analog/RF ICs.

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 18th IEEE European Test Symposium, 2013

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.

Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Spatial estimation of wafer measurement parameters using Gaussian process models.

Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2012 IEEE International Test Conference, 2012

Spatial correlation modeling for probe test cost reduction in RF devices.

Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Parametric counterfeit IC detection via Support Vector Machines.

Ke Huang, John M. Carulli Jr., Yiorgos Makris

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Die-level adaptive test: Real-time test reordering and elimination.

Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar

Proceedings of the 2011 IEEE International Test Conference, 2011

2010

Adapting to adaptive testing.

Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli

Proceedings of the Design, Automation and Test in Europe, 2010

2009

Multidimensional Test Escape Rate Modeling.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch

IEEE Des. Test Comput., 2009

Quality improvement and cost reduction using statistical outlier methods.

Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Modeling Test Escape Rate as a Function of Multiple Coverages.

Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

The Impact of Multiple Failure Modes on Estimating Product Field Reliability.

John M. Carulli Jr., Thomas J. Anderson

IEEE Des. Test Comput., 2006

2005

Test connections - tying application to process.

John M. Carulli Jr., Thomas J. Anderson

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Impact of Negative Bias Temperature Instability on Product Parametric Drift.

Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004