Michael van Ginkel

According to our database, Michael van Ginkel authored at least 6 papers between 2001 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2005

The generalized Radon transform: Sampling, accuracy and memory considerations.

Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet

Pattern Recognit., 2005

2003

Robust Curve Detection Using a Radon Transform in Orientation Space.

Michael van Ginkel, M. A. Kraaijveld, Lucas J. van Vliet, E. P. Reding, Piet W. Verbeek, H. J. Lammers

Proceedings of the Image Analysis, 13th Scandinavian Conference, 2003

The Generalised Radon Transform: Sampling and Memory Considerations.

Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet

Proceedings of the Computer Analysis of Images and Patterns, 10th International Conference, 2003

A New Sharpness Measure Based on Gaussian Lines and Edges.

Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the Computer Analysis of Images and Patterns, 10th International Conference, 2003

2002

Recursive Gabor filtering.

Ian T. Young, Lucas J. van Vliet, Michael van Ginkel

IEEE Trans. Signal Process., 2002

2001

Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.

Joost van de Weijer, Lucas J. van Vliet, Piet W. Verbeek, Michael van Ginkel

IEEE Trans. Pattern Anal. Mach. Intell., 2001