Piet W. Verbeek

According to our database, Piet W. Verbeek authored at least 38 papers between 1977 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2011

Continuous Orientation Representation for Arbitrary Dimensions - A Generalized Knutsson Mapping.

Bernd Rieger, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the Image Analysis - 17th Scandinavian Conference, 2011

2006

Lightness filtering in color images with respect to the gamut.

Judith Dijk, Piet W. Verbeek

Proceedings of the 3rd European Conference on Colour in Graphics, Imaging, and Vision, 2006

2005

The generalized Radon transform: Sampling, accuracy and memory considerations.

Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet

Pattern Recognit., 2005

2004

On Curvature Estimation of ISO Surfaces in 3D Gray-Value Images and the Computation of Shape Descriptors.

Bernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek

IEEE Trans. Pattern Anal. Mach. Intell., 2004

Quantitative Imaging: How to Measure Size Features in Digitized Images.

Lucas J. van Vliet, Piet W. Verbeek, Ian T. Young

Proceedings of the 2004 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 2004

2003

Estimation of Curvature Based Shape Properties of Surfaces in 3D Grey-Value Images.

Bernd Rieger, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the Image Analysis, 13th Scandinavian Conference, 2003

Robust Curve Detection Using a Radon Transform in Orientation Space.

Michael van Ginkel, M. A. Kraaijveld, Lucas J. van Vliet, E. P. Reding, Piet W. Verbeek, H. J. Lammers

Proceedings of the Image Analysis, 13th Scandinavian Conference, 2003

The D-Dimensional Inverse Vector-Gradient Operator and Its Application for Scale-Free Image Enhancement.

Piet W. Verbeek, Judith Dijk

Proceedings of the Computer Analysis of Images and Patterns, 10th International Conference, 2003

The Generalised Radon Transform: Sampling and Memory Considerations.

Cris L. Luengo Hendriks, Michael van Ginkel, Piet W. Verbeek, Lucas J. van Vliet

Proceedings of the Computer Analysis of Images and Patterns, 10th International Conference, 2003

A New Sharpness Measure Based on Gaussian Lines and Edges.

Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the Computer Analysis of Images and Patterns, 10th International Conference, 2003

2002

Curvature Estimation of Surfaces in 3D Grey-Value Images.

Bernd Rieger, Frederik J. Timmermans, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the 16th International Conference on Pattern Recognition, 2002

The Effect of Gamma and Chroma on the Perception of Color Images.

Judith Dijk, Piet W. Verbeek, Jan Walraven, Ian T. Young

Proceedings of the First European Conference on Colour in Graphics, Imaging, and Vision, 2002

2001

Curvature Estimation in Oriented Patterns Using Curvilinear Models Applied to Gradient Vector Fields.

Joost van de Weijer, Lucas J. van Vliet, Piet W. Verbeek, Michael van Ginkel

IEEE Trans. Pattern Anal. Mach. Intell., 2001

Confidence and Curvature Estimation of Curvilinear Structures in 3-D.

Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the Eighth International Conference On Computer Vision (ICCV-01), Vancouver, British Columbia, Canada, July 7-14, 2001, 2001

2000

Scale-Adaptive Landmark Detection, Classification and Size Estimation in 3D Object-Background Images.

René G. de Vries, Piet W. Verbeek

Proceedings of the 15th International Conference on Pattern Recognition, 2000

1999

The Applicability of Neural Networks to Non-linear Image Processing.

Dick de Ridder, Robert P. W. Duin, Piet W. Verbeek

Pattern Anal. Appl., 1999

Edge Preserving Orientation Adaptive Filtering.

Peter Bakker, Lucas J. van Vliet, Piet W. Verbeek

Proceedings of the 1999 Conference on Computer Vision and Pattern Recognition (CVPR '99), 1999

1998

Recursive Gaussian derivative filters.

Lucas J. van Vliet, Ian T. Young, Piet W. Verbeek

Proceedings of the Fourteenth International Conference on Pattern Recognition, 1998

Improved curvature and anisotropy estimation for curved line bundles.

Piet W. Verbeek, Lucas J. van Vliet, Joost van de Weijer

Proceedings of the Fourteenth International Conference on Pattern Recognition, 1998

On the Application of Neural Networks to Non-Linear Image Processing Tasks.

Dick de Ridder, Robert P. W. Duin, Piet W. Verbeek, Lucas J. van Vliet

Proceedings of the Fifth International Conference on Neural Information Processing, 1998

1997

Design Considerations for a Range Image Sensor Containing a PSD-array and An On-chip Multiplexer.

Michiel de Bakker, Piet W. Verbeek, Gijs K. Steenvoorden

Proceedings of the International Conference on Recent Advances in 3-D Digital Imaging and Modeling (3DIM '97), 1997

1996

Block position dithering in DCT-coded sequences.

Marnix K. N. Schöyer, Piet W. Verbeek

Signal Process. Image Commun., 1996

Fast analytical medial-axis localization in convex polyhedra.

Maarten P. P. Schlicher, Erik Bouts, Piet W. Verbeek

Proceedings of the 13th International Conference on Pattern Recognition, 1996

High-speed acquisition of range images.

Michiel de Bakker, Piet W. Verbeek, Frank van den Ouden, Gijs K. Steenvoorden

Proceedings of the 13th International Conference on Pattern Recognition, 1996

1994

Edge localization by MoG filters: Multiple-of-Gaussians.

Lucas J. van Vliet, Piet W. Verbeek

Pattern Recognit. Lett., 1994

On the Location Error of Curved Edges in Low-Pass Filtered 2-D and 3-D Images.

Piet W. Verbeek, Lucas J. van Vliet

IEEE Trans. Pattern Anal. Mach. Intell., 1994

1993

Binary and Grey-Value Skeletons: Metrics and Algorithms.

Ben J. H. Verwer, Lucas J. van Vliet, Piet W. Verbeek

Int. J. Pattern Recognit. Artif. Intell., 1993

1992

Line and edge detection by symmetry filters.

Piet W. Verbeek, Lucas J. van Vliet

Proceedings of the 11th IAPR International Conference on Pattern Recognition, 1992

An estimator of edge length and surface area in digitized 2D and 3D images.

Piet W. Verbeek, Lucas J. van Vliet

Proceedings of the 11th IAPR International Conference on Pattern Recognition, 1992

1990

Shading from shape, the eikonal equation solved by grey-weighted distance transform.

Piet W. Verbeek, Ben J. H. Verwer

Pattern Recognit. Lett., 1990

1989

2-D adaptive smoothing by 3-D distance transformation.

Piet W. Verbeek, Ben J. H. Verwer

Pattern Recognit. Lett., 1989

An Efficient Uniform Cost Algorithm Applied to Distance Transforms.

Ben J. H. Verwer, Piet W. Verbeek, Simon T. Dekker

IEEE Trans. Pattern Anal. Mach. Intell., 1989

1986

Collision Avoidance and Path Finding through Constrained Distance Tranceformation in Robot State Space.

Piet W. Verbeek, Leo Dorst, Ben J. H. Verwer, Frans C. A. Groen

Proceedings of the Intelligent Autonomous Systems, 1986

1985

A class of sampling-error free measures in oversampled band-limited images.

Piet W. Verbeek

Pattern Recognit. Lett., 1985

1984

Implementation of cellular-logic operators using 3*3 convolution and table lookup hardware.

Frans A. Gerritsen, Piet W. Verbeek

Comput. Vis. Graph. Image Process., 1984

1981

The smallest box around a package.

Frans C. A. Groen, Piet W. Verbeek, N. de Jong, J. W. Klumper

Pattern Recognit., 1981

1980

Three-Dimensional Skeletonization: Principle and Algorithm.

Steven Lobregt, Piet W. Verbeek, Frans C. A. Groen

IEEE Trans. Pattern Anal. Mach. Intell., 1980

1977

Computation of DNA-based parameters from chromosome scans.

Frans C. A. Groen, Piet W. Verbeek, M. van der Ploeg

Proceedings of the Digital Bildverarbeitung, 1977