Nadun Sinhabahu

According to our database, Nadun Sinhabahu authored at least 3 papers between 2022 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing.

Nadun Sinhabahu, Katherine Shu-Min Li, Sying-Jyan Wang, J. R. Wang, Matt Ho

Proceedings of the IEEE International Test Conference, 2023

2022

Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test.

Nadun Sinhabahu, Katherine Shu-Min Li, Jian-De Li, J. R. Wang, Sying-Jyan Wang

Proceedings of the IEEE International Test Conference, 2022

Trojan Insertions of Fully Programmable Valve Arrays.

Nadun Sinhabahu, Jian-De Li, Katherine Shu-Min Li, Sying-Jyan Wang, Tsung-Yi Ho

Proceedings of the IEEE European Test Symposium, 2022