Nicholas J. Stessman

According to our database1, Nicholas J. Stessman authored at least 2 papers in 1995.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

1995
Reducing test application time in scan design schemes.
Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

System-Level Design for Test of Fully Differential Analog Circuits.
Proceedings of the 32st Conference on Design Automation, 1995


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