P. C. Chang

According to our database, P. C. Chang authored at least 9 papers between 2001 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation.

P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector.

P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018

Application of Particle Swarm Optimization to Solve Configuration Change Problems.

Z. H. Che, H. S. Wang, P. C. Huang, P. C. Chang, Y. S. Lee

Proceedings of the 7th International Congress on Advanced Applied Informatics, 2018

2016

Intelligent search techniques for network-based manufacturing systems: multi-objective formulation and solutions.

Vijaya Kumar Manupati, P. C. Chang, Manoj Kumar Tiwari

Int. J. Comput. Integr. Manuf., 2016

2011

CNS activation maps in awake rats exposed to thermal stimuli to the dorsum of the hindpaw.

Lino Becerra, P. C. Chang, James Bishop, David Borsook

NeuroImage, 2011

Remote time and frequency calibration system for telecommunication synchronization applications.

Jia-Lun Wang, P. C. Chang, Shinn-Yan Lin, Huang-Tien Lin, Chia-Shu Liao

Proceedings of the 13th Asia-Pacific Network Operations and Management Symposium, 2011

2006

GaN MSM photodetectors with photo-CVD annealed Ni/Au electrodes.

Y. D. Jhou, C. H. Chen, S. J. Chang, Y. K. Su, P. C. Chang, P. C. Chen, H. Hung, C. L. Yu, S. M. Wang, M. H. Wu

Microelectron. J., 2006

2003

Detection of Welding Flaws With MLP Neural Network and Case Based Reasoning.

T. Warren Liao, Evangelos Triantaphyllou, P. C. Chang

Intell. Autom. Soft Comput., 2003

2001

Effect of solder creep on the reliability of large area die attachment.

W. D. Zhuang, P. C. Chang, F. Y. Chou, R. K. Shiue

Microelectron. Reliab., 2001