J. H. Lee
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Bibliography
2023
Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2020
4.1 A 39GHz-Band CMOS 16-Channel Phased-Array Transceiver IC with a Companion Dual-Stream IF Transceiver IC for 5G NR Base-Station Applications.
Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2018
A new approach to motion judder cancellation: Time stamp model using instant frame rate.
Proceedings of the IEEE International Conference on Consumer Electronics, 2018
2017
Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017
A sol-gel integrated dual-readout microarray platform for quantification and identification of prostate-specific antigen.
Proceedings of the International Symposium on Micro-NanoMechatronics and Human Science, 2017
Proceedings of the International SoC Design Conference, 2017
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
2014
Proceedings of the IEEE International Conference on Consumer Electronics, 2014
2013
Proceedings of the 15th Asia-Pacific Network Operations and Management Symposium, 2013
2012
Silicon nitride etch characteristics in SF<sub>6</sub>/O<sub>2</sub> and C<sub>3</sub>F<sub>6</sub>O/O<sub>2</sub> plasmas and evaluation of their global warming effects.
Microelectron. Reliab., 2012
2010
2008
IEEE Trans. Haptics, 2008
2007
Adaptive beamforming using uniform circular arrays under mutual coupling environments.
Proceedings of the Signal and Image Processing (SIP 2007), 2007
Automatic Detection Algorithm for Residual Quantity of Ringer's Solution.
Proceedings of the International Conference on Bioinformatics & Computational Biology, 2007
2006
Survivable Network Architectures for Wavelength-division-multiplexed Passive Optical Networks.
Photonic Netw. Commun., 2006
2005
Optical characteristics of In(Ga)As quantum dots on (100) InP substrate for 1.5mum laser diodes.
Microelectron. J., 2005
2004
Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and Interfacial / High-K Bi-Layer Structure.
Microelectron. Reliab., 2004
2003
The extension of STEP PDM schema for information sharing in a practical application.
Proceedings of the Enhanced Interoperable Systems. Proceedings of the 10th ISPE International Conference on Concurrent Engineering (ISPE CE 2003), 2003
XML based information exchange between PDM systems in CPC environment.
Proceedings of the Enhanced Interoperable Systems. Proceedings of the 10th ISPE International Conference on Concurrent Engineering (ISPE CE 2003), 2003
Efficient speech enhancement based on left-right HMM with state sequence detection using LRT.
Proceedings of the 8th European Conference on Speech Communication and Technology, EUROSPEECH 2003, 2003
2001
Proceedings of the Medical Imaging 2001: Image Processing, 2001
2000
Proceedings of the IEEE/RSJ International Conference on Intelligent Robots and Systems, 2000
Proceedings of the 2000 IEEE International Conference on Communications: Global Convergence Through Communications, 2000
1999
n-Gram-based indexing for Korean text retrieval.
Inf. Process. Manag., 1999
1998
Proceedings of the 9th IEEE International Symposium on Personal, 1998
1990
IEEE Trans. Acoust. Speech Signal Process., 1990