P. S. Das

According to our database¹, P. S. Das authored at least 2 papers between 2010 and 2012.

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2012

Investigations on electrical characteristics and reliability properties of MOS capacitors using HfAlO<sub>x</sub> on n-GaAs substrates.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2012

2010

Charge trapping and reliability characteristics of ultra-thin HfYO<sub>x</sub> films on n-GaAs substrates.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2010