Pavan Kumar Javvaji

Orcid: 0000-0003-4678-5934

According to our database1, Pavan Kumar Javvaji authored at least 6 papers between 2017 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2020
Test Pattern Generation and Critical Path Selection in the Presence of Statistical Delays.
IEEE Trans. Very Large Scale Integr. Syst., 2020

2019
On the Sensitization Probability of a Critical Path Considering Process Variations and Path Correlations.
IEEE Trans. Very Large Scale Integr. Syst., 2019

2018
Test set identification for improved delay defect coverage in the presence of statistical delays.
Proceedings of the 19th International Symposium on Quality Electronic Design, 2018

Scalable Fault Coverage Estimation of Sequential Circuits without Fault Injection.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

A Method to Model Statistical Path Delays for Accurate Defect Coverage.
Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2017
Efficient computation of the sensitization probability of a critical path considering process variations and path correlation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017


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