Peter Breitschopf

According to our database, Peter Breitschopf authored at least 4 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling.

Roland Biberger, Guenther Benstetter, Thomas Schweinböck, Peter Breitschopf, Holger Goebel

Microelectron. Reliab., 2008

2005

Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling.

Peter Breitschopf, Guenther Benstetter, Bernhard Knoll, Werner Frammelsberger

Microelectron. Reliab., 2005

2004

New trends in the application of Scanning Probe Techniques in Failure Analysis.

Thomas Schweinböck, S. Schömann, D. Álvarez, Marco Buzzo, Werner Frammelsberger, Peter Breitschopf, Günther Benstetter

Microelectron. Reliab., 2004

AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis.

Günther Benstetter, Peter Breitschopf, Werner Frammelsberger, Heiko Ranzinger, Peter Reislhuber, Thomas Schweinböck

Microelectron. Reliab., 2004