Thomas Schweinböck

According to our database1, Thomas Schweinböck authored at least 8 papers between 2003 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2017
Determination of doping type by calibrated capacitance scanning microwave microscopy.
Microelectron. Reliab., 2017

2016
Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale.
Microelectron. Reliab., 2016

2014
Quantitative Scanning Microwave Microscopy: A calibration flow.
Microelectron. Reliab., 2014

2008
Intermittent-contact scanning capacitance microscopy versus contact mode SCM applied to 2D dopant profiling.
Microelectron. Reliab., 2008

2004
New trends in the application of Scanning Probe Techniques in Failure Analysis.
Microelectron. Reliab., 2004

2D Dopant Profiling on 4H Silicon Carbide P<sup>+</sup>N Junction by Scanning Capacitance and Scanning Electron Microscopy.
Microelectron. Reliab., 2004

AFM-based scanning capacitance techniques for deep sub-micron semiconductor failure analysis.
Microelectron. Reliab., 2004

2003
Characterization of thin and ultra-thin SiO<sub>2</sub> films and SiO<sub>2</sub>/Si interfaces with combined conducting and topographic atomic force microscopy.
Microelectron. Reliab., 2003


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