Marco Buzzo

According to our database, Marco Buzzo authored at least 5 papers between 2002 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

Characterization of photonic devices by secondary electron potential contrast.

Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner

Microelectron. Reliab., 2006

2005

Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast.

Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner

Microelectron. Reliab., 2005

2004

New trends in the application of Scanning Probe Techniques in Failure Analysis.

Thomas Schweinböck, S. Schömann, D. Álvarez, Marco Buzzo, Werner Frammelsberger, Peter Breitschopf, Günther Benstetter

Microelectron. Reliab., 2004

2D Dopant Profiling on 4H Silicon Carbide P⁺N Junction by Scanning Capacitance and Scanning Electron Microscopy.

Marco Buzzo, Markus Leicht, Thomas Schweinböck, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner

Microelectron. Reliab., 2004

2002

Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction.

Maria Stangoni, Mauro Ciappa, Marco Buzzo, Markus Leicht, Wolfgang Fichtner

Microelectron. Reliab., 2002