Peter Jacob

According to our database, Peter Jacob authored at least 17 papers between 2004 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Toward an Optimal Definition of Hypoglycemia with Continuous Glucose Monitoring.

Zeinab Mahmoudi, Simone Del Favero, Peter Jacob, Pratik Choudhary, Hypo-RESOLVE Consortium

Comput. Methods Programs Biomed., 2021

2017

New ESD challenges in RFID manufacturing.

Peter Jacob, Uwe Thiemann

Microelectron. Reliab., 2017

A very unusual transistor failure, caused by a solenoid.

Peter Jacob, Roman Furrer

Microelectron. Reliab., 2017

2016

Failure mechanisms and precautions in plug connectors and relays.

Peter Jacob

Microelectron. Reliab., 2016

Early life field failures in modern automotive electronics - An overview; root causes and precautions.

Peter Jacob

Microelectron. Reliab., 2016

2015

Failure analysis and reliability on system level.

Peter Jacob

Microelectron. Reliab., 2015

Unusual defects, generated by wafer sawing: An update, including pick&place processing.

Peter Jacob

Microelectron. Reliab., 2015

2013

Failure causes generating aluminium protrusion/extrusion.

Peter Jacob, Giovanni Nicoletti

Microelectron. Reliab., 2013

2011

From component to system failure analysis - The future challenge within work-sharing supply chains.

Peter Jacob

Microelectron. Reliab., 2011

Impact of IT-supported clinical pathways on medical staff satisfaction. A prospective longitudinal cohort study.

Jochen Schuld, Thilo Schäfer, Stefan Nickel, Peter Jacob, Martin K. Schilling, Sven Richter

Int. J. Medical Informatics, 2011

2009

Reading distance degradation mechanisms of near-field RFID devices.

Peter Jacob, Willy Knecht, Albert Kunz, Giovanni Nicoletti, Thomas Lautenschlager, Moreno Mondada, Damien Pachoud

Microelectron. Reliab., 2009

2008

Unusual defects, generated by wafer sawing: Diagnosis, mechanisms and how to distinguish from related failures.

Peter Jacob, Werner Rothkirch

Microelectron. Reliab., 2008

Surface ESD (ESDFOS) in assembly fab machineries as a functional and reliability risk - Failure analysis, tool diagnosis and on-site-remedies.

Peter Jacob

Microelectron. Reliab., 2008

2007

Device decapsulated (and/or depassivated) - Retest ok - What happened?

Peter Jacob, Giovanni Nicoletti, Florian Hauf

Microelectron. Reliab., 2007

2006

Reliability and wearout characterisation of LEDs.

Peter Jacob, Albert Kunz, Giovanni Nicoletti

Microelectron. Reliab., 2006

2005

Electrostatic discharge directly to the chip surface, caused by automatic post-wafer processing.

Peter Jacob, Uwe Thiemann, Joachim C. Reiner

Microelectron. Reliab., 2005

2004

Electrostatic Effects on Semiconductor Tools.

Peter Jacob, Joachim C. Reiner

Microelectron. Reliab., 2004