Pin Xie

According to our database¹, Pin Xie authored at least 3 papers between 1999 and 2003.

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2003

A golden-block-based self-refining scheme for repetitive patterned wafer inspections.

[BibT_eX]

[DOI]

Mach. Vis. Appl., 2003

2000

A golden-template self-generating method for patterned wafer inspection.

[BibT_eX]

[DOI]

Mach. Vis. Appl., 2000

1999

A Golden Block Self-Generating Scheme for Continuous Patterned Wafer Inspections.

[BibT_eX]

[DOI]

Proceedings of the 1oth International Conference on Image Analysis and Processing (ICIAP 1999), 1999