Ping-Chin Yeh

According to our database, Ping-Chin Yeh authored at least 7 papers between 2015 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Estimation of Product Lifetime with Highly Varying Die Temperature.

Jae-Gyung Ahn, Md Malekkul Islam, Gamal Refai-Ahmed, Bhoomika Devaru Hedge, Guan-Yu Lin, Po-Chiao Chang, Ping-Chin Yeh, Jonathan Chang

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2022

Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation.

Jae-Gyung Ahn, Jim Wesselkamper, Ryan S. W. Baek, Ping-Chin Yeh, Jonathan Chang, Jennifer Wong, Xin Wu

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model.

Jae-Gyung Ahn, Rhesa Nathanael, I-Ru Chen, Ping-Chin Yeh, Jonathan Chang

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Estimation of Product Reliability using TDDB Simulation and Statistical EM Method.

Jae-Gyung Ahn, Ping-Chin Yeh, Jonathan Chang

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Design-For-Reliability Flow in 7nm Products with Data Center and Automotive Applications.

Jae-Gyung Ahn, I-Ru Chen, Ping-Chin Yeh, Jonathan Chang

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Electromigration failure rate of redundant via.

Jae-Gyung Ahn, Ping-Chin Yeh, Jonathan Chang

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Product-level reliability estimator with budget-based reliability management in 20nm technology.

Jae-Gyung Ahn, Ming Feng Lu, Nitin Navale, Dawn Graves, Ping-Chin Yeh, Jonathan Chang, S. Y. Pai

Proceedings of the IEEE International Reliability Physics Symposium, 2015