Pranay Jhunjhunwala

According to our database, Pranay Jhunjhunwala authored at least 8 papers between 2020 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Formal verification of observers supervising a cyber-physical system implemented using IEC 61499.

Polina Ovsiannikova, Etienne Le Priol, Vincent Perret, Pranay Jhunjhunwala, Midhun Xavier, Valeriy Vyatkin

Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023

Towards migration from IEC 61131-3 to IEC 61499 in process industry: redesign of visualisation.

Hiruni Kothalawala, Pranay Jhunjhunwala, Valeriy Vyatkin

Proceedings of the 32nd IEEE International Symposium on Industrial Electronics, 2023

Design Pattern for Industrial Control Applications Based on One-Line IEC 61499 Adapter Connections.

Pranay Jhunjhunwala, Polina Ovsiannikova, Valeriy Vyatkin

Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023

2022

Proposing and Prototyping an Extension to the Adapter Concept in the IEC 61499 Standard.

Pranay Jhunjhunwala, Valeriy Vyatkin

IEEE Access, 2022

Monitoring design pattern for distributed automation systems in IEC 61499 and its formal modelling.

Pranay Jhunjhunwala, Alois Zoitl, Udayanto Dwi Atmojo, Valeriy Vyatkin

Proceedings of the 31st IEEE International Symposium on Industrial Electronics, 2022

2021

Applying Skill-based Engineering using OPC-UA in Production System with a Digital Twin.

Pranay Jhunjhunwala, Udayanto Dwi Atmojo, Valeriy Vyatkin

Proceedings of the 30th IEEE International Symposium on Industrial Electronics, 2021

A Design Pattern for Monitoring Adapter Connections in IEC 61499.

Pranay Jhunjhunwala, Jan Olaf Blech, Alois Zoitl, Udayanto Dwi Atmojo, Valeriy Vyatkin

Proceedings of the 22nd IEEE International Conference on Industrial Technology, 2021

2020

Towards Implementation of Interoperable Smart Sensor Services in IEC 61499 for Process Automation.

Pranay Jhunjhunwala, Udayanto Dwi Atmojo, Valeriy Vyatkin

Proceedings of the 25th IEEE International Conference on Emerging Technologies and Factory Automation, 2020