R. Hoffmann
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Bibliography
2022
Reliability of Ferroelectric and Antiferroelectric Si: HfO2 materials in 3D capacitors by TDDB studies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination.
Proceedings of the IEEE International Memory Workshop, 2022
Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability.
Proceedings of the IEEE International Memory Workshop, 2022
2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
1992
Proceedings of the Mustererkennung 1992, 1992
1976
Proceedings of the eighth international conference on APL, 1976