Randy Wolf

According to our database, Randy Wolf authored at least 9 papers between 2001 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

SiGe HBTs for Power Amplifiers in Front-End of Radio Communication Systems.

Alvin J. Joseph, Vibhor Jain, John J. Pekarik, Ajay Raman, Shafi Syed, Liu Hang, Ned Cahoon, Randy Wolf, Venkat Vanukuru, Elan Veeramani, Beng Woon Lim, Uppili S. Raghunathan, Qizhi Liu, Yves Ngu

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2018

Technology Positioning for mm Wave Applications: 130/90nm SiGe BiCMOS vs. 28nm RFCMOS.

Alvin Joseph, Vibhor Jain, Shih Ni Ong, Randy Wolf, Suh Fei Lim, Jagar Singh

Proceedings of the 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018

2015

2.4/5.5GHz LNA switch designs based on high resistive substrate 0.35um SiGe BiCMOS.

Chaojiang Li, Xiaoxia Wang, Vibhor Jain, Hanyi Ding, Myra Boenke, Dawn Wang, Randy Wolf, Alvin J. Joseph

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

2013

Integrated silicon RF front-end solutions for mobile communications.

Alvin Joseph, Randy Wolf

Proceedings of the IEEE 10th International Conference on ASIC, 2013

2007

RF Testing on a Mixed Signal Tester.

Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat, Mustapha Slamani

J. Electron. Test., 2007

2004

RF Testing on a Mixed Signal Tester.

Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

A low-cost test solution for wireless phone RFICs.

John Ferrario, Randy Wolf, Steve Moss, Mustapha Slamani

IEEE Commun. Mag., 2003

Architecting Millisecond Test Solutions for Wireless Phone RFIC's.

John Ferrario, Randy Wolf, Steve Moss

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2001

Moving from mixed signal to RF test hardware development.

John Ferrario, Randy Wolf, Hanyi Ding

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001