Mustapha Slamani

According to our database1, Mustapha Slamani authored at least 33 papers between 1992 and 2016.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2016
OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization.
IEEE Trans. Circuits Syst. II Express Briefs, 2016

2015
Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector.
IEEE Trans. Very Large Scale Integr. Syst., 2015

2014
Continuous wave radar circuitry testing using OFDM technique.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique.
J. Electron. Test., 2013

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion.
Proceedings of the 18th IEEE European Test Symposium, 2013

2012
Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Analog/RF test ordering in the early stages of production testing.
Proceedings of the 30th IEEE VLSI Test Symposium, 2012

2011
Extraction of EVM from Transmitter System Parameters.
Proceedings of the 16th European Test Symposium, 2011

Correlating inline data with final test outcomes in analog/RF devices.
Proceedings of the Design, Automation and Test in Europe, 2011

2010
RF Specification Test Compaction Using Learning Machines.
IEEE Trans. Very Large Scale Integr. Syst., 2010

Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude.
Proceedings of the 2011 IEEE International Test Conference, 2010

2009
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.
J. Electron. Test., 2009

2008
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction.
Proceedings of the 13th European Test Symposium, 2008

2007
RF Testing on a Mixed Signal Tester.
J. Electron. Test., 2007

Non-RF to RF Test Correlation Using Learning Machines: A Case Study.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006
A BICMOS 120 MW 11 GHZ transimpedance amplifier Dedicated for High-Speed Photoreceivers.
J. Circuits Syst. Comput., 2006

2005
Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail?
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004
ITC 2003 panels: Part 2.
IEEE Des. Test Comput., 2004

2003
A low-cost test solution for wireless phone RFICs.
IEEE Commun. Mag., 2003

RF Test 101: Defining the Problem, Finding Solutions.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
Wireless Test.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge?
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface.
J. Electron. Test., 2001

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques.
J. Electron. Test., 2001

2000
A preamplifier IC design for photonic links.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

1999
An efficient RF power transfer and bidirectional data transmission to implantable electronic devices.
Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999

A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach.
Proceedings of the 1999 International Symposium on Circuits and Systems, ISCAS 1999, Orlando, Florida, USA, May 30, 1999

1998
Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing.
Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

1995
Multifrequency Analysis of Faults in Analog Circuits.
IEEE Des. Test Comput., 1995

1994
Multifrequency testability analysis for analog circuits.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters.
Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1992
Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing.
IEEE Des. Test Comput., 1992


  Loading...