Robert Jérisian

According to our database1, Robert Jérisian authored at least 4 papers between 2001 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2004
Comparative study of thermal cycling and thermal shocks tests on electronic components reliability.
Microelectron. Reliab., 2004

2003
Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3.
Microelectron. Reliab., 2003

2002
Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal fatigue study in Q1 compared to Q2.
Microelectron. Reliab., 2002

2001
Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects.
Microelectron. Reliab., 2001


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