Robert P. Treuer

According to our database, Robert P. Treuer authored at least 4 papers between 1985 and 1993.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

1993

Built-In Self-Diagnosis for Repairable Embedded RAMs.

Robert P. Treuer, Vinod K. Agarwal

IEEE Des. Test Comput., 1993

Fault Location Algorithms for Repairable Embedded.

Robert P. Treuer, Vinod K. Agarwal

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1987

A New Built-In Self-Test Design for PLA's with High Fault Coverage and Low Overhead.

Robert P. Treuer, Vinod K. Agarwal, Hideo Fujiwara

IEEE Trans. Computers, 1987

1985

Implementing a Built-In Self-Test PLA Design.

Robert P. Treuer, Hideo Fujiwara, Vinod K. Agarwal

IEEE Des. Test, 1985