Rosa D. Reinosa

According to our database, Rosa D. Reinosa authored at least 4 papers between 2004 and 2010.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2010

Characterizing mechanical performance of Board Level Interconnects for In-Circuit Test.

Rosa D. Reinosa, Aileen Allen, Elizabeth Benedetto, Alan Mcallister

Proceedings of the 2011 IEEE International Test Conference, 2010

2006

Lead Free Through Hole Technology (THT) and Contact Repeatability in In-Circuit Test.

Rosa D. Reinosa

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Effect of lead free solders on in-circuit test process.

Rosa D. Reinosa

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Test Strategy Cost Model Innovations.

Carlos Michel, Rosa D. Reinosa

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004