Roya Dibaj

Orcid: 0000-0002-8255-9443

According to our database¹, Roya Dibaj authored at least 2 papers between 2017 and 2018.

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2018

Gate Oxide Short Defect Model in FinFETs.

[DOI]

J. Electron. Test., 2018

2017

Comprehensive investigation of gate oxide short in FinFETs.

[DOI]

Proceedings of the 35th IEEE VLSI Test Symposium, 2017