S. Cascino

According to our database, S. Cascino authored at least 2 papers between 2007 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs.

Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, S. Cascino, Angelo Alberto Messina, Vincenzo Vinciguerra, Michele Calabretta, Alessandro Chini

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2007

Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.

Domenico Corso, S. Aurite, E. Sciacca, D. Naso, Salvatore Lombardo, A. Santangelo, M. C. Nicotra, S. Cascino

Microelectron. Reliab., 2007