Salvatore Lombardo

According to our database1, Salvatore Lombardo authored at least 22 papers between 2002 and 2018.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2018
Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions.
Microelectron. Reliab., 2018

2017
Towards a nanofabricated vacuum cold-emitting triode.
Proceedings of the 14th International Conference on Synthesis, 2017

Silicon photomultipliers with embedded optical filters for wearable healthcare applications.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017

Flexible CW-fNIRS system based on Silicon Photomultipliers: In-vivo characterization of sensorimotor response.
Proceedings of the 2017 IEEE SENSORS, Glasgow, United Kingdom, October 29, 2017

2016
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks.
Microelectron. Reliab., 2016

2015
General features of progressive breakdown in gate oxides: A compact model.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014
Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures.
Proceedings of the Smart Digital Futures 2014, 2014

VIRGO: An Innovative Virtual Registry of Underground Infrastructure on Cloud.
Proceedings of the Euro Med Telco Conference, 2014

CY5 fluorescence measured with silicon photomultipliers.
Proceedings of the IEEE Biomedical Circuits and Systems Conference, 2014

2010
Radiation effects in nitride read-only memories.
Microelectron. Reliab., 2010

2009
Feasibility Studies on Si-Based Biosensors.
Sensors, 2009

2008
Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories.
IEEE Trans. Instrum. Meas., 2008

A novel approach to characterization of progressive breakdown in high-k/metal gate stacks.
Microelectron. Reliab., 2008

2007
Guest Editorial.
Microelectron. Reliab., 2007

Study of nanocrystal memory integration in a Flash-like NOR device.
Microelectron. Reliab., 2007

Defects induced anomalous breakdown kinetics in Pr<sub>2</sub>O<sub>3</sub> by micro- and nano-characterization.
Microelectron. Reliab., 2007

Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage.
Microelectron. Reliab., 2007

2005
Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric.
Microelectron. Reliab., 2005

Structure of the oxide damage under progressive breakdown.
Microelectron. Reliab., 2005

2003
Reliability of ultra-thin oxides in CMOS circuits.
Microelectron. Reliab., 2003

2002
Analysis of the effect of the gate oxide breakdown on SRAM stability.
Microelectron. Reliab., 2002

Dependence of Post-Breakdown Conduction on Gate Oxide Thickness.
Microelectron. Reliab., 2002


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