S. G. Mhaisalkar

According to our database, S. G. Mhaisalkar authored at least 3 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2006

A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects.

M. Y. Yan, King-Ning Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy

Microelectron. Reliab., 2006

Reliability studies of barrier layers for Cu/PAE low-k interconnects.

Hung Son Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang

Microelectron. Reliab., 2006

2004

Electromigration behavior of dual-damascene Cu interconnects--Structure, width, and length dependences.

A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy

Microelectron. Reliab., 2004