Sami A. Al-Arian

According to our database, Sami A. Al-Arian authored at least 17 papers between 1984 and 2000.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2000

Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits.

Bassam Shaer, David L. Landis, Sami A. Al-Arian

IEEE Trans. Very Large Scale Integr. Syst., 2000

Partitioning sequential circuits for pseudoexhaustive testing.

Bassam Shaer, Sami A. Al-Arian, David L. Landis

IEEE Trans. Very Large Scale Integr. Syst., 2000

1999

Pseudo-Exhaustive Testing of Sequential Circuits.

Bassam Shaer, Sami A. Al-Arian, David L. Landis

Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

1998

Partitioning algorithm to enhance VLSI testability.

Bassam Shaer, Sami A. Al-Arian, David L. Landis

Proceedings of the 36th Annual ACM Southeast Regional Conference, 1998

1997

A New Heuristic Algorithm for Estimating Signal and Detection Probabilities.

Musaed A. Al-Kharji, Sami A. Al-Arian

Proceedings of the 7th Great Lakes Symposium on VLSI (GLS-VLSI '97), 1997

1996

A novel built-in current sensor for I_DDQ testing of deep submicron CMOS ICs.

Stephan P. Athan, David L. Landis, Sami A. Al-Arian

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1994

Reconfigurable Linear Feedback Register Design, Analysis & Applications.

Randy E. Bolling, Sami A. Al-Arian

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994

Improving the Testability of VLSI Circuits through Partitioning.

Sami A. Al-Arian, Randy E. Bolling

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994

1993

A Method for Consistent Fault Coverage Reporting.

Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian

IEEE Des. Test Comput., 1993

Degrading fault model for WSI interconnection lines.

Hussam Y. Abujbara, Sami A. Al-Arian

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

1992

Fault Simulation and Test Generation by Fault Sampling Techniques.

Sami A. Al-Arian, Musaed A. Al-Kharji

Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992

1991

A Unique Approach to Built-in-Self-Test Circuit Design.

Sami A. Al-Arian, Hussam Y. Abujbara, Jim C. Ruel

Proceedings of the Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1991

1990

Self-testing and self-reconfiguration architecture for 2-D WSI arrays.

Hussam Y. Abujbara, Sami A. Al-Arian

Proceedings of the Second IEEE Symposium on Parallel and Distributed Processing, 1990

Three approaches to design fault tolerant programmable logic arrays.

Sami A. Al-Arian, Hari P. Kunamneni

Proceedings of the 28th Annual Southeast Regional Conference, 1990

1989

Design and Test in the Universities.

Sami A. Al-Arian

Proceedings of the Proceedings International Test Conference 1989, 1989

1988

Defining a Standard for Fault Simulator Evaluation.

Sami A. Al-Arian, Kevin A. Kwiat

Proceedings of the Proceedings International Test Conference 1988, 1988

1984

Comprehensive Fault Model and Testing of CMOS Circuits.

Dharma P. Agrawal, Sami A. Al-Arian

Proceedings of the Proceedings International Test Conference 1984, 1984