Sangbong Lee

According to our database, Sangbong Lee authored at least 10 papers between 2004 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Explainable AI-based root-cause diagnosis of maritime engine anomalies with external factors.

Mingyu Park, Hyunju Kim, Sangbong Lee, Donghyun Kim, Jihwan Lee

Comput. Ind. Eng., 2026

2023

Feature Attribution Analysis to Quantify the Impact of Oceanographic and Maneuverability Factors on Vessel Shaft Power Using Explainable Tree-Based Model.

Donghyun Kim, Melia Putri Handayani, Sangbong Lee, Jihwan Lee

Sensors, February, 2023

2021

Explainable Anomaly Detection Framework for Maritime Main Engine Sensor Data.

Donghyun Kim, Gian Antariksa, Melia Putri Handayani, Sangbong Lee, Jihwan Lee

Sensors, 2021

Data gap analysis of ship and maritime data using meta learning.

Miyeon Jeon, Yoojeong Noh, Kyunghwan Jeon, Sangbong Lee, Inwon Lee

Appl. Soft Comput., 2021

2020

An Ensemble-Based Approach to Anomaly Detection in Marine Engine Sensor Streams for Efficient Condition Monitoring and Analysis.

Donghyun Kim, Sangbong Lee, Jihwan Lee

Sensors, 2020

Data-Driven Prediction of Vessel Propulsion Power Using Support Vector Regression with Onboard Measurement and Ocean Data.

Donghyun Kim, Sangbong Lee, Jihwan Lee

Sensors, 2020

Fabrication of Dental Crown by Optical Coherence Tomography: A Pilot Study.

Sangbong Lee, Keunbada Son, Jaeyul Lee, Mansik Jeon, Kyu-Bok Lee, Jeehyun Kim

IEEE Access, 2020

2019

Non-Ionized, High-Resolution Measurement of Internal and Marginal Discrepancies of Dental Prosthesis Using Optical Coherence Tomography.

Sangbong Lee, Keunbada Son, Jaeseok Park, Jaeyul Lee, Seok Hyon Kang, Ruchire Eranga Wijesinghe, Pilun Kim, Jun Ho Hwang, Sungjo Park, Byoung-Ju Yun, Mansik Jeon, Kyu-Bok Lee, Jeehyun Kim

IEEE Access, 2019

2004

An Experimental Study of N-Detect Scan ATPG Patterns on a Processor.

Srikanth Venkataraman, Srihari Sivaraj, M. Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor.

M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004