Seulki Park

According to our database, Seulki Park authored at least 11 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

RoCOCO: Robust Benchmark MS-COCO to Stress-test Robustness of Image-Text Matching Models.

Seulki Park, Daeho Um, Hajung Yoon, Sanghyuk Chun, Sangdoo Yun, Jin Young Choi

CoRR, 2023

Highly Reliable/Manufacturable 4nm FinFET Platform Technology (SF4X) for HPC Application with Dual-CPP/HP-HD Standard Cells.

Kihwang Son, Seulki Park, Kyunghoon Jung, Jun-Gyu Kim, Younggun Ko, Keonyong Cheon, Changkeun Yoon, Jiho Kim, Jaehun Jeong, Taehun Myung, Changmin Hong, Weonwi Jang, Min-Chul Sun, Sungil Jo, Ju-Youn Kim, Byungmoo Song, Yuri Yasuda-Masuoka, Ja-Hum Ku, Gitae Jeong

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

Confidence-Based Feature Imputation for Graphs with Partially Known Features.

Daeho Um, Jiwoong Park, Seulki Park, Jin Young Choi

Proceedings of the Eleventh International Conference on Learning Representations, 2023

Online Boundary-Free Continual Learning by Scheduled Data Prior.

Hyunseo Koh, Minhyuk Seo, Jihwan Bang, Hwanjun Song, Deokki Hong, Seulki Park, Jung-Woo Ha, Jonghyun Choi

Proceedings of the Eleventh International Conference on Learning Representations, 2023

Novel Regularization via Logit Weight Repulsion for Long-Tailed Classification.

Taegil Ha, Seulki Park, Jin Young Choi

Proceedings of the 34th British Machine Vision Conference 2023, 2023

2022

The Majority Can Help the Minority: Context-rich Minority Oversampling for Long-tailed Classification.

Seulki Park, Youngkyu Hong, Byeongho Heo, Sangdoo Yun, Jin Young Choi

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022

Hypergraph-Induced Semantic Tuplet Loss for Deep Metric Learning.

Jongin Lim, Sangdoo Yun, Seulki Park, Jin Young Choi

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022

Online Continual Learning on a Contaminated Data Stream with Blurry Task Boundaries.

Jihwan Bang, Hyunseo Koh, Seulki Park, Hwanjun Song, Jung-Woo Ha, Jonghyun Choi

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022

2021

Over-Fit: Noisy-Label Detection based on the Overfitted Model Property.

Seulki Park, Dae Ung Jo, Jin Young Choi

CoRR, 2021

Influence-Balanced Loss for Imbalanced Visual Classification.

Seulki Park, Jongin Lim, Younghan Jeon, Jin Young Choi

Proceedings of the 2021 IEEE/CVF International Conference on Computer Vision, 2021

2015

Impact of the double-patterning technique on the LER-induced threshold voltage variation in symmetric tunnel field-effect transistor.

Seulki Park, Ju Han Lee, Changhwan Shin

IEICE Electron. Express, 2015