Seung Hoon Tong
Orcid: 0009-0003-6263-5175
According to our database1,
Seung Hoon Tong authored at least 3 papers
between 2008 and 2020.
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Bibliography
2020
A generalised uncertain decision tree for defect classification of multiple wafer maps.
Int. J. Prod. Res., 2020
2015
2008
A dual burn-in policy for defect-tolerant memory products using the number of repairs as a quality indicator.
Microelectron. Reliab., 2008