Shunji Maeda

According to our database, Shunji Maeda authored at least 10 papers between 1990 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

A Basic Study on Railway Facility Extraction Using a Single-Shot Multi-Box Detector.

Masami Nakamura, Yuta Aoto, Shunji Maeda

Proceedings of the 2019 International Conference on Machine Learning and Cybernetics, 2019

Analyzing Causal Relationships of Sensor Data and Infrared Images to Stabilize Garbage Power Generation.

Kanta Matsubayashi, Takuya Anjiki, Shunji Maeda

Proceedings of the 2019 International Conference on Machine Learning and Cybernetics, 2019

Utilization of the Infrared Image Capturing Combustion State for Estimating the Steam Flow Aming to Stabilize Garbage Power Generation.

Takuya Anjiki, Kanta Matsubayashi, Shunji Maeda

Proceedings of the 2019 International Conference on Machine Learning and Cybernetics, 2019

2018

320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor.

Yuichi Kato, Takuya Sano, Yusuke Moriyama, Shunji Maeda, Takeshi Yamazaki, Atsushi Nose, Kimiyasu Shiina, Yohtaro Yasu, Ward van der Tempel, Alper Ercan, Yoshiki Ebiko, Daniel Van Nieuwenhove, Shunichi Sukegawa

IEEE J. Solid State Circuits, 2018

2013

Unified evaluation method of white uniformity for electronic displays.

Toshio Asano, Takahiro Kondoh, Shunji Maeda

Proceedings of the IECON 2013, 2013

1999

Precise detection of short-circuit defects on TFT substrate by infrared image matching.

Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani

Syst. Comput. Jpn., 1999

1998

Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison.

Shunji Maeda, Fumiaki Endo, Hiroshi Makihira, Hitoshi Kubota

Syst. Comput. Jpn., 1998

1996

Optimum threshold generation for automated visual inspection of large-scale integration wafer patterns.

Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira

Syst. Comput. Jpn., 1996

1994

Precise visual inspection for LSI wafer patterns using subpixel image alignment.

Takashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa

Proceedings of Second IEEE Workshop on Applications of Computer Vision, 1994

1990

Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm.

Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira, Takanori Ninomiya, Yasuo Nakagawa, Yuzo Taniguchi

Syst. Comput. Jpn., 1990