Si-Yan Lin

According to our database, Si-Yan Lin authored at least 3 papers between 2005 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection.

Chuan-Yu Chang, ChunHsi Li, Si-Yan Lin, MuDer Jeng

IEEE Trans. Syst. Man Cybern. Part C, 2009

2006

Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection.

Chuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin

Proceedings of the Advances in Applied Artificial Intelligence, 2006

2005

Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection.

Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng

Proceedings of the IEEE International Conference on Automation Science and Engineering, 2005