We stand with Ukraine

We stand with Ukraine

Songwei Pei

Orcid: 0000-0002-7926-5727

According to our database¹, Songwei Pei authored at least 23 papers between 2009 and 2023.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

Legend:

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In proceedings

Article

PhD thesis

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Links

On csauthors.net:

Bibliography

2023

NMPose: Leveraging Normal Maps for 6D Pose Estimation.

[BibT_eX]

[DOI]

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Proceedings of the Neural Information Processing - 30th International Conference, 2023

PO-DARTS: Post-optimizing the Architectures Searched by Differentiable Architecture Search Algorithms.

[BibT_eX]

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Proceedings of the Artificial Neural Networks and Machine Learning - ICANN 2023, 2023

2021

A parallel sparse triangular solve algorithm based on dependency elimination of the solution vector.

[BibT_eX]

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Clust. Comput., 2021

2020

A variation tolerant scheme for memristor crossbar based neural network designs via two-phase weight mapping and memristor programming.

[BibT_eX]

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Future Gener. Comput. Syst., 2020

On Improving Fault Tolerance of Memristor Crossbar Based Neural Network Designs by Target Sparsifying.

[BibT_eX]

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Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2018

A low-overhead RO PUF design for Xilinx FPGAs.

[BibT_eX]

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IEICE Electron. Express, 2018

An effective structure and flow for pre-bond TSV test.

[BibT_eX]

[DOI]

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IEICE Electron. Express, 2018

2017

On-Chip Ring Oscillator Based Scheme for TSV Delay Measurement.

[BibT_eX]

[DOI]

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Alrashdi Ahmed Rabehb

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Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

A Cost-Effective Energy Optimization Framework of Multicore SoCs Based on Dynamically Reconfigurable Voltage-Frequency Islands.

[BibT_eX]

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ACM Trans. Design Autom. Electr. Syst., 2016

Statistical energy optimization on voltage-frequency island based MPSoCs in the presence of process variations.

[BibT_eX]

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Microelectron. J., 2016

2015

Corrigendum to "Fast and scalable lock methods for video coding on many-core architecture" [J. Visual Communication and Image Representation 25 (7) (2014) 1758-1762].

[BibT_eX]

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J. Vis. Commun. Image Represent., 2015

An on-chip frequency programmable test clock generation and application method for small delay defect detection.

[BibT_eX]

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Integr., 2015

On optimizing system energy of multi-core SoCs based on dynamically reconfigurable voltage-frequency island.

[BibT_eX]

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Proceedings of the VLSI Design, Automation and Test, 2015

An Effective TSV Self-Repair Scheme for 3D-Stacked ICs.

[BibT_eX]

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Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015

Enhanced LCCG: A novel test clock generation scheme for faster-than-at-speed delay testing.

[BibT_eX]

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Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Fast and scalable lock methods for video coding on many-core architecture.

[BibT_eX]

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J. Vis. Commun. Image Represent., 2014

Variation-aware statistical energy optimization on voltage-frequency island based MPSoCs under performance yield constraints.

[BibT_eX]

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Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014

2012

Flip-Flop Selection for Partial Enhanced Scan to Reduce Transition Test Data Volume.

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IEEE Trans. Very Large Scale Integr. Syst., 2012

A High-Precision On-Chip Path Delay Measurement Architecture.

[BibT_eX]

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IEEE Trans. Very Large Scale Integr. Syst., 2012

2011

A unified test architecture for on-line and off-line delay fault detections.

[BibT_eX]

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Proceedings of the 29th IEEE VLSI Test Symposium, 2011

2010

An on-chip clock generation scheme for faster-than-at-speed delay testing.

[BibT_eX]

[DOI]

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Proceedings of the Design, Automation and Test in Europe, 2010

2009

Flip-Flop Selection for Transition Test Pattern Reduction Using Partial Enhanced Scan.

[BibT_eX]

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Proceedings of the 2009 15th IEEE Pacific Rim International Symposium on Dependable Computing, 2009

A Low Overhead On-Chip Path Delay Measurement Circuit.

[BibT_eX]

[DOI]

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Proceedings of the Eighteentgh Asian Test Symposium, 2009

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