Soshi Takeshita

Orcid: 0000-0002-4747-1980

According to our database1, Soshi Takeshita authored at least 1 paper in 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2019
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2019


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