Stefan Schrunner

Orcid: 0000-0003-1327-4855

According to our database1, Stefan Schrunner authored at least 15 papers between 2017 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Online presence:

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Bibliography

2023
UBayFS: An R Package for User Guided Feature Selection.
J. Open Source Softw., January, 2023

Principal component-based image segmentation: a new approach to outline <i>in vitro</i> cell colonies.
Comput. methods Biomech. Biomed. Eng. Imaging Vis., January, 2023

Towards Understanding the Survival of Patients with High-Grade Gastroenteropancreatic Neuroendocrine Neoplasms: An Investigation of Ensemble Feature Selection in the Prediction of Overall Survival.
CoRR, 2023

2022
A user-guided Bayesian framework for ensemble feature selection in life science applications (UBayFS).
Mach. Learn., 2022

Ranking Feature-Block Importance in Artificial Multiblock Neural Networks.
Proceedings of the Artificial Neural Networks and Machine Learning - ICANN 2022, 2022

2021
RENT: A Python Package for Repeated Elastic Net Feature Selection.
J. Open Source Softw., 2021

Multiblock-Networks: A Neural Network Analog to Component Based Methods for Multi-Source Data.
CoRR, 2021

Machine Learning based Indicators to Enhance Process Monitoring by Pattern Recognition.
CoRR, 2021

Principal component-based image segmentation: a new approach to outline in vitro cell colonies.
CoRR, 2021

RENT - Repeated Elastic Net Technique for Feature Selection.
IEEE Access, 2021

2020
An Explicit Solution for Image Restoration using Markov Random Fields.
J. Signal Process. Syst., 2020

A generative semi-supervised classifier for datasets with unknown classes.
Proceedings of the SAC '20: The 35th ACM/SIGAPP Symposium on Applied Computing, online event, [Brno, Czech Republic], March 30, 2020

2019
A Health Factor for Process Patterns Enhancing Semiconductor Manufacturing by Pattern Recognition in Analog Wafermaps.
Proceedings of the 2019 IEEE International Conference on Systems, Man and Cybernetics, 2019

2018
A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data.
Proceedings of the 17th IEEE International Conference on Machine Learning and Applications, 2018

2017
Markov random fields for pattern extraction in analog wafer test data.
Proceedings of the Seventh International Conference on Image Processing Theory, 2017


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