Olivia Bluder

According to our database, Olivia Bluder authored at least 7 papers between 2011 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

A Comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data.

Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kästner, Roman Kern

Proceedings of the 17th IEEE International Conference on Machine Learning and Applications, 2018

Quantification and Prediction of Damage in SAM Images of Semiconductor Devices.

Dzenana Alagic, Olivia Bluder, Jürgen Pilz

Proceedings of the Image Analysis and Recognition - 15th International Conference, 2018

2017

Markov random fields for pattern extraction in analog wafer test data.

Stefan Schrunner, Olivia Bluder, Anja Zernig, Andre Kästner, Roman Kern

Proceedings of the Seventh International Conference on Image Processing Theory, 2017

2014

Device level maverick screening: detection of risk devices through independent component analysis.

Anja Zernig, Olivia Bluder, Jürgen Pilz, Andre Kästner

Proceedings of the 2014 Winter Simulation Conference, 2014

Modeling and prediction of smart power semiconductor lifetime data using a gaussian process prior.

Kathrin Plankensteiner, Olivia Bluder, Jürgen Pilz

Proceedings of the 2014 Winter Simulation Conference, 2014

Modeling fatigue life of power semiconductor devices with ε-N fields.

Olivia Bluder, Kathrin Plankensteiner, Michael Nelhiebel, Walther Heinz, Christian Leitner

Proceedings of the 2014 Winter Simulation Conference, 2014

2011

Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability.

Olivia Bluder, Michael Glavanovics, Jürgen Pilz

Microelectron. Reliab., 2011