Steven Slupsky

According to our database, Steven Slupsky authored at least 5 papers between 2005 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

Contactless testing: Possibility or pipe-dream?

Erik Jan Marinissen, Dae Young Lee, John P. Hayes, Chris Sellathamby, Brian Moore, Steven Slupsky, Laurence Pujol

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes.

Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky

Proceedings of the 2008 IEEE International Test Conference, 2008

Chip to chip communications for terabit transmission rates.

Brian Moore, Chris Sellathamby, Steven Slupsky, Kris Iniewski

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008

2007

High throughput non-contact SiP testing.

Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky

Proceedings of the 2007 IEEE International Test Conference, 2007

2005

Noncontact wafer probe using wireless probe cards.

Chris Sellathamby, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Steven Slupsky, Igor M. Filanovsky, Kris Iniewski

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005