Sung-Il Chan

According to our database, Sung-Il Chan authored at least 4 papers between 2011 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection.

Dongshin Kim, Ju-Hwan Choi, Nochang Park, Sung-Il Chan, Yongchae Jeong

Microelectron. Reliab., 2018

2017

Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data.

Wonwook Oh, Soo Hyun Bae, Sung-Il Chan, Hae-Seok Lee, Donghwan Kim, Nochang Park

Microelectron. Reliab., 2017

2016

Evaluation of potential-induced degradation in crystalline Si solar cells using Na fault injection.

Wonwook Oh, Junhee Kim, Byungjun Kang, Soo Hyun Bae, Kyung Dong Lee, Hae-Seok Lee, Donghwan Kim, Sung-Il Chan

Microelectron. Reliab., 2016

2011

Accelerated life test of high power white light emitting diodes based on package failure mechanisms.

Sung-Il Chan, W. S. Hong, K. T. Kim, Yang Gi Yoon, J. H. Han, Joong Soon Jang

Microelectron. Reliab., 2011