Sverre Wichlund

According to our database, Sverre Wichlund authored at least 6 papers between 1998 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Scan Test Response Compaction Combined with Diagnosis Capabilities.

Sverre Wichlund, Frank Berntsen, Einar J. Aas

J. Electron. Test., 2008

2006

Reducing ATE Bandwidth and memory requirements: A diagnosis friendly scan test response compactor.

Sverre Wichlund, Frank Berntsen, Einar J. Aas

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

Reducing Scan Test Data Volume and Time: A Diagnosis Friendly Finite Memory Compactor.

Sverre Wichlund, Einar J. Aas

Proceedings of the 15th Asian Test Symposium, 2006

2005

Achieving design closure in a typical mixed-signal ASIC; a Design-For-Test centric approach.

Sverre Wichlund

Proceedings of the 12th IEEE International Conference on Electronics, 2005

2000

On efficient CPU-usage in a VLSI CAD-environment with application to circuit partitioning.

Sverre Wichlund, Einar J. Aas

Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

1998

On multilevel circuit partitioning.

Sverre Wichlund

Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, 1998