T. Gebel

According to our database1, T. Gebel authored at least 1 paper in 2002.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

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Links

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Bibliography

2002
Charge trapping and degradation in Ge<sup>+</sup> ion implanted SiO<sub>2</sub> layers during high-field electron injection.
Microelectron. Reliab., 2002


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